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| TECHNICAL DATA SL74LV04 Hex Inverter The SL74LV04 is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT04A. The SL74LV04 provides six inverting buffers. * * * * Wide Operating Voltage: 1.0 ~ 5.5 V Optimized for Low Voltage applications: 1.0 ~ 3.6 V Accepts TTL input levels between VCC =2.7 V and VCC =3.6 V Low Input Current ORDERING INFORMATION SL74LV04N Plastic SL74LV04D SOIC SL74LV04 Chip TA = -40 / 125 C for all packages LOGIC DIAGRAM PIN ASSIGNMENT FUNCTION TABLE Input A L H Output Y H L PIN 14 =VCC PIN 7 = GND SLS System Logic Semiconductor 1 SL74LV04 MAXIMUM RATINGS * Symbol VCC IIK* 1 Parameter DC supply voltage (Referenced to GND) DC input diode current DC output diode current DC output source or sink current -bus driver outputs DC GND current for types with - bus driver outputs DC VCC current for types with - bus driver outputs Power dissipation per package, plastic DIP+ SOIC package+ Storage temperature Lead temperature, 1.5 mm from Case for 10 seconds (Plastic DIP ), 0.3 mm (SOIC Package) Value -0.5 ~ +7.0 20 50 25 50 50 750 500 -65 ~ +150 260 Unit V mA mA mA mA mA mW C C IOK* 2 Io* 3 IGND ICC PD Tstg TL * Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions. +Derating - Plastic DIP: - 12 mW/C from 70 to 125C SOIC Package: : - 8 mW/C from 70 to 125C * 1: VI < -0.5V or VI > VCC+0.5V * 2: Vo < -0.5V or Vo > VCC+0.5V * 3: -0.5V < Vo < VCC+0.5V RECOMMENDED OPERATING CONDITIONS Symbol VCC VIN, VOUT TA tr, t f Parameter DC Supply Voltage (Referenced to GND) DC Input Voltage, Output Voltage (Referenced to GND) Operating Temperature, All Package Types Input Rise and Fall Time VCC =1.2 V VCC =2.0 V VCC =3.0 V VCC =3.6 V Min 1.0 0 -40 0 0 0 0 Max 5.5 VCC +125 1000 700 500 400 Unit V V C ns This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high-impedance circuit. For proper operation, V and VOUT should be constrained to the range IN GND(VIN or VOUT)VCC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open. SLS System Logic Semiconductor 2 SL74LV04 DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND) Guaranteed Limit Symbol Parameter Test Conditions VCC, V min VIH High-Level Input Voltage 1.2 2.0 3.0 3.6 1.2 2.0 3.0 3.6 1.2 2.0 * * 1.2 2.0 3.0 0.9 1.4 2.1 2.5 1.1 1.92 2.92 2.48 max 0.3 0.6 0.9 1.1 0.09 0.09 0.09 0.33 min 0.9 1.4 2.1 2.5 1.0 1.9 2.9 2.34 max 0.3 0.6 0.9 1.1 0.1 0.1 0.1 0.4 25C -40C / 85C -40C / 125C min 0.9 1.4 2.1 2.5 1.0 1.9 2.9 2.20 max 0.3 0.6 0.9 1.1 0.1 0.1 0.1 0.5 V Unit VIL Low-Level Input Voltage V VOH High-Level Output VI = VIL Voltage IO = -50 A VI = VIL IO = -6.0 A V V V VOL Low-Level Output VI = VIH Voltage IO = 50 A VI = VIH or VIL IO = 6.0 mA V IIL III INN Low-Level Input Leakage Current High-Level Input VI = VCC Leakage Current Quiescent Supply VI = 0 A or VCC Current IO = 0 A (per Package) * * - -0.1 0.1 2.0 - -1.0 1.0 20 - -1.0 1.0 40 A A A * : VCC= (3.30.3) V SLS System Logic Semiconductor 3 SL74LV04 AC ELECTRICAL CHARACTERISTICS (CL=50 pF, t LH = t HL = 6.0 ns, VIL=0V, VIH=VCC, RL=1 kU) VCC Symbol Parameter V min tTHL, (t TLH) Output Transition Time, Any Output (Figure 1) Propagation Delay, Input A to Output Y (Figure 1) Input Capacitance 1.2 2.0 * 1.2 2.0 * 3.0 25C max 70 16 10 90 23 14 Guaranteed Limit -40C / 85C min max 85 20 13 120 28 18 3.5 -40C / 125C min max 100 24 15 150 34 21 3.5 pF pF ns Unit tPHL, (t PLH) CI CPD Power Dissipation Capacitance (Per Inverter) O A=25N, VI=0V/VCC 42 Used to determine the no-load dynamic power consumption: PD = CPDVCC2fI+ (CLVCC2fo), fI - input frequency, fo - output frequency (MHz) (CLVCC2fo) - sum of the outputs tHL tLH V CC Input A 0.1 0.9 V1 0.9 V1 0.1 tPHL 0.9 tPLH 0.9 V1 0.1 0.1 GND V CC Output Y V 1 = 0.5 VC C V1 tTHL tTLH GND Figure 1. Switching Waveforms V CC VI PULSE GENERATOR RT DEVICE UNDER TEST VO Termination resistance RT - should be equal to ZOUT of pulse generators CL RL Figure 2. Test Circuit SLS System Logic Semiconductor 4 SL74LV04 CHIP PAD DIAGRAM SL74LV04 12 13 11 10 09 08 14 07 06 01 02 03 04 05 1.35 0.03 Pad size 0.108 x 0.108 mm (Pad size is given as per metallization layer) Thickness of chip 0.46 0,02 mm PAD LOCATION Pad No 01 02 03 04 05 06 07 08 09 10 11 12 13 14 Symbol A1 Y1 A2 Y2 A3 Y3 GND Y4 A4 Y5 A5 Y6 A6 Vcc X 0.111 0.333 0.600 0.770 1.006 1.138 1.138 1.138 1.006 0.771 0.600 0.332 0.111 0.111 Y 0.228 0.111 0.111 0.111 0.111 0.293 0.477 0.786 0.970 0.970 0.970 0.970 0.855 0.619 SLS System Logic Semiconductor 1.20 0.03 Chip marking 25LV04 (x=0.127; y=0.580) 5 |
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